Effective medium approximation of the optical properties of electrochromic cerium-titanium oxide compounds

Conference · Tue Jul 01 04:00:00 EDT 1997

OSTI ID:589197

Rottkay, K von; Richardson, T; Rubin, M; Slack, J

Cerium titanium oxide samples derived from a solution have been compared against sputtered films over a wide range of different compositions. X-ray diffraction was used to investigate the structural properties of the compound material existing in a two-phase mixture M{sub A}O{sub 2}-M{sub B}O{sub 2}. The optical properties were evaluated over the whole solar spectrum by variable angle spectroscopic ellipsometry combined with spectrophotometry. The spectral complex refractive index was determined for CeO{sub 2} and TiO{sub 2}, as well as for their compounds. To reduce the large number of permutations in composition of multi-component oxides it would be useful to be able to predict the properties of the mixtures from the pure oxide components. Therefore these results were compared to those obtained by effective medium theory utilizing the optical constants of CeO{sub 2} and TiO{sub 2}. In order to investigate the performance as passive counter-electrode in Li{sup +} based electrochromic devices the films were tested by cyclic voltammetry with in-situ transmission control. Chemical composition was measured by Rutherford backscattering spectrometry. Surface morphology was analyzed by atomic force microscopy.

• Research Organization: Lawrence Berkeley Lab., CA (United States)
• Sponsoring Organization: USDOE Assistant Secretary for Energy Efficiency and Renewable Energy, Washington, DC (United States)
• DOE Contract Number: AC03-76SF00098
• OSTI ID: 589197
• Report Number(s): LBNL--40668; CONF-970706--; OM--369; ON: DE98052710
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
66 PHYSICS
CERIUM OXIDES
ELECTROCHEMISTRY
OPTICAL PROPERTIES
THIN FILMS
TITANIUM OXIDES
X-RAY DIFFRACTION