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Low energy electron impact attachment and ionization in HgBr/sub 2/

Journal Article · · Appl. Phys. Lett.; (United States)
DOI:https://doi.org/10.1063/1.93049· OSTI ID:5880357
Cross sections for low energy electron impact attachment and ionization in mercuric bromide (HgBr/sub 2/) have been measured using an electron beam experiment. The ion products of these reactions, as identified by mass analysis, are Br/sup -/ and chiefly HgBr/sup +//sub 2/. Rate coefficients computed from the measured cross sections were found to be in good agreement with values determined independently from an electron swarm experiment.
Research Organization:
United Technologies Research Center, East Hartford, Connecticut 06108
OSTI ID:
5880357
Journal Information:
Appl. Phys. Lett.; (United States), Journal Name: Appl. Phys. Lett.; (United States) Vol. 40:3; ISSN APPLA
Country of Publication:
United States
Language:
English