Direct methods of analyzing diffuse scattering

Journal Article · Sun Jul 01 04:00:00 EDT 1979 · AIP (Am. Inst. Phys.) Conf. Proc.; (United States)

DOI:https://doi.org/10.1063/1.31865· OSTI ID:5873270

Georgopoulos, P; Cohen, J B

Methods of analysis of diffuse scattering have now reached the stage where thee are well tested and documented standard procedures for a variety of materials, and software, for both x-rays and neutrons. These methods and their meaning Are briefly reviewed.

• Research Organization: Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439
• OSTI ID: 5873270
• Report Number(s): CONF-790341-
• Journal Information: AIP (Am. Inst. Phys.) Conf. Proc.; (United States), Journal Name: AIP (Am. Inst. Phys.) Conf. Proc.; (United States) Vol. 53:1; ISSN APCPC
• Country of Publication: United States
• Language: English

Related Subjects

654003 -- Radiation & Shielding Physics-- Neutron Interactions with Matter
656000* -- Condensed Matter Physics
73 NUCLEAR PHYSICS AND RADIATION PHYSICS
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
COHERENT SCATTERING
CRYSTAL STRUCTURE
CRYSTALS
DEBYE-WALLER FACTOR
DIFFRACTION
LATTICE VIBRATIONS
NEUTRON DIFFRACTION
PATTERSON METHOD
POLARIZATION
ROUGHNESS
SCATTERING
SURFACE PROPERTIES
X-RAY DIFFRACTION