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Quartz gauge response in ion radiation

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.50850· OSTI ID:587172
; ;  [1]; ; ;  [2];  [3]
  1. Atomic Weapons Establishment, Aldermaston, Reading, Berkshire, (United Kingdom), RG7 4PR
  2. Ktech Corporation, 901 Pennsylvania NE, Albuquerque, New Mexico 87110 (United States)
  3. Sandia National Laboratories, P.O. Box 5800, Albuquerque, New Mexico 87185 (United States)

This paper describes recent work to make high quality quartz gauge (temporal and spatial) shock wave measurements in a pulsed ion beam environment. Intense ion beam radiation, nominally 1 MeV protons, was deposited into material samples instrumented with shunted quartz gauges adjacent to the ion deposition zone. Fluence levels were chosen to excite three fundamentally different material response modes (1) strong vapor, (2) combined vapor and melt phase and (3) thermoelastic material response. A unique quartz gauge design was utilized that employed printed circuit board (PCB) technology to facilitate electrical shielding, ruggedness, and fabrication while meeting the essential one dimensional requirements of the characterized Sandia shunted quartz gauge. Shock loading and unloading experiments were conducted to evaluate the piezoelectric response of the coupled quartz gauge/PCB transducer. High fidelity shock wave profiles were recorded at the three ion fluence levels providing dynamic material response data for vapor, melt and solid material phases. {copyright} {ital 1996 American Institute of Physics.}

OSTI ID:
587172
Report Number(s):
CONF-950846--
Journal Information:
AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 370; ISSN APCPCS; ISSN 0094-243X
Country of Publication:
United States
Language:
English

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