Electro-optical technique for intense microwave measurements

Journal Article · Sat Jun 01 00:00:00 EDT 1985 · J. Appl. Phys.; (United States)

DOI:https://doi.org/10.1063/1.335304· OSTI ID:5865212

Chang, J; Vittitoe, C N; Neyer, B T; Ballard, W P

An electro-optical technique has been developed to measure high-frequency electric fields in free space. Electrically induced birefringence in an electro-optical crystal is used to modulate a linearly polarized continuous-wave laser beam. The modulation impressed on the laser beam contains both frequency and field intensity information. A way to use this technique as both a frequency and power meter is discussed. A proof-of-principle experiment has been carried out with a 3.1-GHz magnetron source.

• Research Organization: Sandia National Laboratories, Post Office Box 5800, Albuquerque, New Mexico 87185
• OSTI ID: 5865212
• Journal Information: J. Appl. Phys.; (United States), Journal Name: J. Appl. Phys.; (United States) Vol. 57:11; ISSN JAPIA
• Country of Publication: United States
• Language: English

Related Subjects

440300* -- Miscellaneous Instruments-- (-1989)
47 OTHER INSTRUMENTATION
AMPLITUDES
BIREFRINGENCE
CRYSTALS
DIELECTRIC PROPERTIES
ELECTRIC FIELDS
ELECTRICAL PROPERTIES
ELECTRO-OPTICAL EFFECTS
ELECTROMAGNETIC RADIATION
ELECTRON TUBES
ELECTRONIC EQUIPMENT
EQUIPMENT
FREQUENCY MEASUREMENT
KERR EFFECT
LASER RADIATION
MAGNETRONS
MEASURING INSTRUMENTS
MICROWAVE EQUIPMENT
MICROWAVE RADIATION
MICROWAVE TUBES
MODULATION
PHYSICAL PROPERTIES
POLARIZATION
RADIATIONS
REFRACTION