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Theory of nonlinear optical absorption associated with free carriers in semiconductors

Journal Article · · IEEE J. Quant. Electron.; (United States)

Calculations are presented of the intensity dependence of the free-carrier absorption in semiconductors by high-intensity light with a wavelength near 10 ..mu..m. The paper is divided into two sections. The first section examines the nonlinear absorptive and dispersive proprties associated with free-hole transitions in semiconductors, and the second section presents calculations of the nonlinear absorption associated with free-electron intraband transitions in germanium. The dominant free-hole absorption of CO/sub 2/ laser light for most p-type semiconductors with a diamond or zinc-blende crystal structure is direct intervalence-band transitions where a hole in the heavy- (or light-) hole band absorbs a photon and makes a direct transition to another band within the valence band structure. The absorption coefficient due to this mechanism is found to decrease with increasing intensity in a manner closely approximated by an inhomogeneously broadened two-level model. Detailed results are presented for the saturation behavior of germanium as a function of temperature, wavelength, and doping density. Calculated values for the intensity dependence of the index of refraction and low-frequency conductivity are presented. Calculated values of the saturation intensity are also given for most of the other Groups IV and III-V semiconductors. In several n-type semiconductors, the dominant absorption of 10 ..mu..m light is free-electron intraband transitions where an electron absorbs a photon and is excited to a state in the same band. The interaction of the electron distribution with the high-intensity light increases the average energy of the electrons and leads to an increase in the free-carrier cross section.

DOE Contract Number:
W-7405-ENG-26
OSTI ID:
5863286
Journal Information:
IEEE J. Quant. Electron.; (United States), Journal Name: IEEE J. Quant. Electron.; (United States) Vol. QE-18:11; ISSN IEJQA
Country of Publication:
United States
Language:
English