Temperature dependence of radiation damage and its annealing in silicon detectors

Conference · Sun Aug 01 04:00:00 EDT 1993 · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)

OSTI ID:5857875

Ziock, H J; Boissevain, J G; Holzscheiter, K; Kapustinsky, J S; Palounek, A P.T.; Sondheim, W E ^[1]; Barberis, E; Cartiglia, N; Leslie, J; Pitzl, D; Rowe, W A; Sadrozinski, H F.W.; Seiden, A; Spencer, E; Wilder, M ^[2]; Ellison, J A; Fleming, J K; Jerger, S; Joyce, D; Lietzke, C ; Reed, E; Wimpenny, S J ^[3]; Ferguson, P ^[4]; Frautschi, M A; Matthews, J A.J.; Skinner, D ^[5]

---

1. Los Alamos National Lab., NM (United States)
2. Univ. of California, Santa Cruz, CA (United States). Santa Cruz Inst. for Particle Physics
3. Univ. of California, Riverside, CA (United States)
4. Univ. of Missouri, Rolla, MO (United States)
5. Univ. of New Mexico, Albuquerque, NM (United States)

The radiation damage resulting from the large particle fluences predicted at the Superconducting Super Collider will induce significant leakage currents in silicon detectors. In order to limit those currents, the authors plan to operate the detectors at reduced temperatures ([approximately] 0 C). In this paper, they present the results of a study of temperature effects on both the initial radiation damage and the long-term annealing of that damage in silicon PIN detectors. Depletion voltage results are reported. The detectors were exposed to approximately 10[sup 14]/cm[sup 2] 650 MeV protons. Very pronounced temperature dependencies were observed.

• OSTI ID: 5857875
• Report Number(s): CONF-921005--
• Conference Information: Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) Journal Volume: 40:4 part 1
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
430303 -- Particle Accelerators-- Experimental Facilities & Equipment
440104 -- Radiation Instrumentation-- High Energy Physics Instrumentation
440200* -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ANNEALING
BARYONS
CURRENTS
DATA
ELECTRIC CURRENTS
ELEMENTARY PARTICLES
EXPERIMENTAL DATA
FERMIONS
HADRONS
HEAT TREATMENTS
INFORMATION
LEAKAGE CURRENT
MEASURING INSTRUMENTS
NUCLEONS
NUMERICAL DATA
PROTONS
RADIATION DETECTORS
RADIATION EFFECTS
SEMICONDUCTOR DETECTORS
SI SEMICONDUCTOR DETECTORS
STORAGE RINGS
SUPERCONDUCTING SUPER COLLIDER
TEMPERATURE DEPENDENCE