Predicting failure stress of silicon nitride ceramics using microfocus radiography

Journal Article · Mon Oct 31 23:00:00 EST 1988 · J. Am. Ceram. Soc.; (United States)

DOI:https://doi.org/10.1111/j.1151-2916.1988.tb07548.x· OSTI ID:5854912

Cotter, D J; Koenigsberg, W D; Pasto, A E; Bowen, L J

Microfocus projection radiography was used to evaluate nondestructively a large quantity of silicon nitride modulus-of-rupture test bars. Quantitative data (size, shape, and location) on major naturally occurring voids in rejected bars were determined from radiographs. Failure stress prediction was attempted using a fracture mechanics model and nondestructive evaluation data and compare to actual failure stress.

• Research Organization: GTE Labs., Inc., Waltham, MA (USA)
• OSTI ID: 5854912
• Journal Information: J. Am. Ceram. Soc.; (United States), Journal Name: J. Am. Ceram. Soc.; (United States) Vol. 71:11; ISSN JACTA
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360202* -- Ceramics
Cermets
& Refractories-- Structure & Phase Studies
360203 -- Ceramics
Cermets
& Refractories-- Mechanical Properties
42 ENGINEERING
420500 -- Engineering-- Materials Testing
DATA ANALYSIS
FAILURES
FRACTURE MECHANICS
INDUSTRIAL RADIOGRAPHY
MATERIALS TESTING
MECHANICS
NITRIDES
NITROGEN COMPOUNDS
NONDESTRUCTIVE TESTING
PNICTIDES
SILICON COMPOUNDS
SILICON NITRIDES
STRESSES
TESTING