Stability of multilayers for synchrotron optics

Journal Article · Mon May 19 00:00:00 EDT 1986 · Appl. Phys. Lett.; (United States)

DOI:https://doi.org/10.1063/1.96907· OSTI ID:5852049

Ziegler, E; Lepetre, Y; Schuller, I K; Spiller, E

The temperature stability of metal (W, WRe, Co, Cr)-carbon multilayers has been studied using x-ray diffraction (theta--2theta and Debye--Scherrer) and electron microscopy. The results show that in all cases a crystallization occurs in the temperature range 650--750 /sup 0/C. As a consequence of this crystallization, the layered structure is destroyed, the surface of the film becomes rough, and the x-ray reflectivity is considerably reduced. These results imply that efficient cooling or new multilayer structures will have to be developed for use at high temperatures or under high x-ray incident flux.

• Research Organization: Materials Science and Technology Division, Argonne National Laboratory, Argonne, Illinois 60439
• DOE Contract Number: W-31-109-ENG-38
• OSTI ID: 5852049
• Journal Information: Appl. Phys. Lett.; (United States), Vol. 48:20
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
CARBON
CRYSTALLIZATION
ROUGHNESS
STABILITY
CHROMIUM
COBALT
RHENIUM COMPOUNDS
TUNGSTEN
TUNGSTEN COMPOUNDS
CRYSTAL-PHASE TRANSFORMATIONS
ELECTRON MICROSCOPY
LAYERS
SYNCHROTRON RADIATION
TEMPERATURE EFFECTS
VERY HIGH TEMPERATURE
X-RAY DIFFRACTION
BREMSSTRAHLUNG
COHERENT SCATTERING
DIFFRACTION
ELECTROMAGNETIC RADIATION
ELEMENTS
METALS
MICROSCOPY
NONMETALS
PHASE TRANSFORMATIONS
RADIATIONS
REFRACTORY METAL COMPOUNDS
SCATTERING
SURFACE PROPERTIES
TRANSITION ELEMENT COMPOUNDS
TRANSITION ELEMENTS
360102* - Metals & Alloys- Structure & Phase Studies