Aluminum particle surface studies in Al/Cu/sub 2/O by electron spectroscopy for chemical analysis and Auger electron spectroscopy

Technical Report · Fri Nov 09 04:00:00 EST 1979

OSTI ID:5845784

Wang, P S; Haws, L D; Moddeman, W E; Rengan, A

Surface chemistry of Al/Cu/sub 2/O thermite powders and pressed pellets undergoing accelerated aging was studied by x-ray photelectron spectroscopy (XPS) and Auger electron spectroscopy (AES). Al 1s, Cu 2P/sub 1/2/, Cu 2P/sub 3/2/, Cu L/sub 3/-M/sub 4/ /sub 5/ M/sub 4/ /sub 5/, O 1S, Al K-L/sub 2/ /sub 3/, L/sub 23/, C 1S, and Cu 3S signals were observed. The Al/sub 2/O/sub 3/ film thicknesses on aluminum metal surfaces were deduced from signal intensity ratios of Al/sup +3/ and aluminum in XPS Al 2S as well as Al K-L/sub 2/ /sub 3/ L/sub 2/ /sub 3/ AES. The oxide thickness on the aluminum powder from the manufacturer was found to be 9A. Mixing of aluminum and Cu/sub 2/O at room temperature to form thermite induced a certain degree of oxidation of the aluminum and increased the oxide film thickness to 11A. Hot pressing of thermite powders at 425/sup 0/C to from pellets increased the oxide layer to 22A. This oxide layer protected the aluminum fuel; further aging of these pellets at 180/sup 0/C for several months caused negligible change on the surface oxide. The bulk of the pellet was found to be stable and of good quality.

• Research Organization: Mound Facility, Miamisburg, OH (USA)
• DOE Contract Number: EY-76-C-04-0053
• OSTI ID: 5845784
• Report Number(s): MLM-2664
• Country of Publication: United States
• Language: English

Related Subjects

45 MILITARY TECHNOLOGY, WEAPONRY, AND NATIONAL DEFENSE
450100* -- Military Technology
Weaponry
& National Defense-- Chemical Explosions & Explosives
ALUMINIUM
AUGER ELECTRON SPECTROSCOPY
CHALCOGENIDES
CHEMICAL REACTIONS
COPPER COMPOUNDS
COPPER OXIDES
ELECTRON SPECTROSCOPY
ELEMENTS
HEAT SOURCES
METALS
OXIDATION
OXIDES
OXYGEN COMPOUNDS
PELLETS
POWDERS
PYROTECHNIC DEVICES
SPECTROSCOPY
SURFACE PROPERTIES
TRANSITION ELEMENT COMPOUNDS
X-RAY SPECTROSCOPY