Polymer film characterization using quartz resonators
In this paper we consider the dynamic behavior and the electrical response of a thickness-shear mode resonator with a polymer film of a few microns thickness coating one face. With glassy polymers (G{prime}{approx}10{sup 10} dyne/cm{sup 2}), this film moves synchronously with the oscillating resonator surface; with rubbery polymers (G{prime}{approx}10{sup 7} dyne/cm{sup 2}), the upper portions of the film lay behind the driven resonator/film interface, causing shear deformation of the film. Interesting dynamic film behavior results, notably a film resonance when the acoustic phase shift across the film is an odd multiple of {pi}/2. This dynamic behavior influences the electrical response of the resonator due to the coupling between shear displacement and the electric field in the piezoelectric quartz. An equivalent circuit model is derived that relates the near-resonant electrical characteristics of a polymer-coated resonator to the film properties. Measurements made on a polyisobutylene-coated resonator were interpreted with the model to obtain the film's shear storage and the loss moduli (G{prime}, G{double prime}), giving good agreement with previously reported values. In addition, changes in resonant frequency and damping observed at film resonance agree with model predictions. 11 refs.
- Research Organization:
- Sandia National Labs., Albuquerque, NM (United States)
- Sponsoring Organization:
- DOE; USDOE, Washington, DC (United States)
- DOE Contract Number:
- AC04-76DP00789
- OSTI ID:
- 5829192
- Report Number(s):
- SAND-91-1319C; CONF-911220--2; ON: DE92006803
- Country of Publication:
- United States
- Language:
- English
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360606 -- Other Materials-- Physical Properties-- (1992-)
42 ENGINEERING
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Electron Devices & Circuits-- (1990-)
COATINGS
DYNAMICS
ELECTRONIC EQUIPMENT
EQUIPMENT
FILMS
FREQUENCY ANALYSIS
MECHANICS
MINERALS
ORGANIC COMPOUNDS
ORGANIC POLYMERS
OXIDE MINERALS
POLYMERS
QUARTZ
RESONATORS
THIN FILMS