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Title: Polymer film characterization using quartz resonators

Conference ·
OSTI ID:5829192

In this paper we consider the dynamic behavior and the electrical response of a thickness-shear mode resonator with a polymer film of a few microns thickness coating one face. With glassy polymers (G{prime}{approx}10{sup 10} dyne/cm{sup 2}), this film moves synchronously with the oscillating resonator surface; with rubbery polymers (G{prime}{approx}10{sup 7} dyne/cm{sup 2}), the upper portions of the film lay behind the driven resonator/film interface, causing shear deformation of the film. Interesting dynamic film behavior results, notably a film resonance when the acoustic phase shift across the film is an odd multiple of {pi}/2. This dynamic behavior influences the electrical response of the resonator due to the coupling between shear displacement and the electric field in the piezoelectric quartz. An equivalent circuit model is derived that relates the near-resonant electrical characteristics of a polymer-coated resonator to the film properties. Measurements made on a polyisobutylene-coated resonator were interpreted with the model to obtain the film's shear storage and the loss moduli (G{prime}, G{double prime}), giving good agreement with previously reported values. In addition, changes in resonant frequency and damping observed at film resonance agree with model predictions. 11 refs.

Research Organization:
Sandia National Labs., Albuquerque, NM (United States)
Sponsoring Organization:
USDOE; USDOE, Washington, DC (United States)
DOE Contract Number:
AC04-76DP00789
OSTI ID:
5829192
Report Number(s):
SAND-91-1319C; CONF-911220-2; ON: DE92006803
Resource Relation:
Conference: IEEE ultrasonics symposium, Lake Buena Vista, FL (United States), 8-11 Dec 1991
Country of Publication:
United States
Language:
English