Transient analysis of low-hysteresis Josephson interferometer with feedback

Journal Article · Fri Jan 01 04:00:00 EST 1982 · J. Appl. Phys.; (United States)

DOI:https://doi.org/10.1063/1.329939· OSTI ID:5825802

Slusky, S E.G.; Jackel, L D

We have performed a transient analysis of a Josephson interferometer in which feedback has been introduced to sharpen the transfer function. We examine the case for junctions with small, but finite, capacitance, so that the junction I-V characteristics have a small hysteresis. We find that no significant changes in switching times occur when feedback is introduced. The transfer function for the interferometer calculated in our ac analysis, which includes finite junction capacitance, is somewhat different from the one determined by a simple dc analysis that assumed zero capacitance.

• Research Organization: Bell Laboratories, Crawford Hill Laboratory, Holmdel, New Jersey 07733
• OSTI ID: 5825802
• Journal Information: J. Appl. Phys.; (United States), Journal Name: J. Appl. Phys.; (United States) Vol. 53:1; ISSN JAPIA
• Country of Publication: United States
• Language: English

Related Subjects

420201* -- Engineering-- Cryogenic Equipment & Devices
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
CAPACITORS
COMPARATIVE EVALUATIONS
COMPUTERIZED SIMULATION
DATA
ELECTRICAL EQUIPMENT
ELECTRICAL PROPERTIES
EQUIPMENT
FEEDBACK
FUNCTIONS
HYSTERESIS
INFORMATION
INTERFEROMETERS
JOSEPHSON JUNCTIONS
JUNCTIONS
MATHEMATICAL MODELS
MEASURING INSTRUMENTS
NUMERICAL DATA
PHYSICAL PROPERTIES
SIMULATION
SUPERCONDUCTING JUNCTIONS
THEORETICAL DATA
TRANSFER FUNCTIONS
TRANSIENTS