Introduction to semi-custom integrated circuits
Conference
·
· IEEE Trans. Nucl. Sci.; (United States)
OSTI ID:5824160
Several manufacturers have in stock processed silicon wafers for analog and digital circuits which can be customized by one or more layers of metallization to interconnect devices to produce application specific I.C.'s (ASIC). The new CAE/CAD tools make it easy to design functional circuits and run full timing and performance simulation before committing to hardware. ASIC's are cost effective for just one particle physics detector.
- Research Organization:
- Gibbs Lab., Yale Univ., New Haven, CT 06511
- DOE Contract Number:
- AC02-76ER03075
- OSTI ID:
- 5824160
- Report Number(s):
- CONF-851009-
- Journal Information:
- IEEE Trans. Nucl. Sci.; (United States), Journal Name: IEEE Trans. Nucl. Sci.; (United States) Vol. NS-33:1; ISSN IETNA
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
42 ENGINEERING
420800 -- Engineering-- Electronic Circuits & Devices-- (-1989)
440101* -- Radiation Instrumentation-- General Detectors or Monitors & Radiometric Instruments
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
COMPUTER-AIDED DESIGN
COMPUTERIZED SIMULATION
COST
ELECTRONIC CIRCUITS
ELEMENTS
INTEGRATED CIRCUITS
MEASURING INSTRUMENTS
MICROELECTRONIC CIRCUITS
PERFORMANCE
RADIATION DETECTORS
SEMIMETALS
SILICON
SIMULATION
TIME MEASUREMENT
420800 -- Engineering-- Electronic Circuits & Devices-- (-1989)
440101* -- Radiation Instrumentation-- General Detectors or Monitors & Radiometric Instruments
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
COMPUTER-AIDED DESIGN
COMPUTERIZED SIMULATION
COST
ELECTRONIC CIRCUITS
ELEMENTS
INTEGRATED CIRCUITS
MEASURING INSTRUMENTS
MICROELECTRONIC CIRCUITS
PERFORMANCE
RADIATION DETECTORS
SEMIMETALS
SILICON
SIMULATION
TIME MEASUREMENT