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Title: Migration of grain boundaries in ceramic materials with particular reference to the sintering process. Progress report, October 1, 1985-April 30, 1986

Technical Report ·
OSTI ID:5820171

The progress made during the past 7 months of a program to study the migration of grain boundaries in ceramic oxides is reported. Results of the program are presented which relate to the structure of grain boundaries in ..cap alpha..-Al/sub 2/O/sub 3/, with important new information discussed for grain boundaries in spinels and germanium. Attention is focused on the analysis of grain boundaries in polycrystalline ..cap alpha..-Al/sub 2/O/sub 3/ compacts, with particular attention being paid to questions relating to the identification of amorphous thin films along interfaces in these materials. It has been found that the techniques used in the past to identify and characterize such films may give misleading or ambiguous results. Analysis of the first-order (..sigma.. = 3) twin interface in spinel have been extended with the development of models for the computer simulation of high-resolution TEM images of these interfaces. Grain boundaries in covalent materials are also discussed. The characterization of surface structures using both imaging and diffraction techniques in the TEM ..cap alpha..-Al/sub 2/O/sub 3/.

Research Organization:
Cornell Univ., Ithaca, NY (USA). Dept. of Materials Science and Engineering
DOE Contract Number:
FG02-84ER45092
OSTI ID:
5820171
Report Number(s):
DOE/ER/45092-T2; ON: DE86011710
Resource Relation:
Other Information: Portions of this document are illegible in microfiche products
Country of Publication:
United States
Language:
English