Measuring verification device error rates

Conference · Wed Jul 01 04:00:00 EDT 1987 · Nucl. Mater. Manage. Annu. Meet. Proc.; (United States)

OSTI ID:5815049

Watson, J G; Johnstone, I M; Driscoll, Jr, E C

A verification device generates a Type I (II) error when it recommends to reject (accept) a valid (false) identity claim. For a given identity, the rates or probabilities of these errors quantify random variations of the device from claim to claim. These are intra-identity variations. To some degree, these rates depend on the particular identity being challenged, and there exists a distribution of error rates characterizing inter-identity variations. However, for most security system applications we only need to know averages of this distribution. These averages are called the pooled error rates. In this paper the authors present the statistical underpinnings for the measurement of pooled Type I and Type II error rates. The authors consider a conceptual experiment, ''a crate of biased coins''. This model illustrates the effects of sampling both within trials of the same individual and among trials from different individuals. Application of this simple model to verification devices yields pooled error rate estimates and confidence limits for these estimates. A sample certification procedure for verification devices is given in the appendix.

• Research Organization: Identix Inc., Palo Alto, CA 94303
• OSTI ID: 5815049
• Report Number(s): CONF-870713-
• Conference Information: Journal Name: Nucl. Mater. Manage. Annu. Meet. Proc.; (United States) Journal Volume: 16
• Country of Publication: United States
• Language: English

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