skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Tunneling spectroscopy study of YBa sub 2 Cu sub 3 O sub 7 thin films using a cryogenic scanning tunneling microscope

Technical Report ·
OSTI ID:5809484

We have measured reproducible tunneling spectra on YBa{sub 2}Cu{sub 3}0{sub 7} thin films with a cryogenic scanning tunneling microscope. We find that the I-V curves are generally of three types. The most common type, featured in a large majority of the data, shows a region of high conductance at zero bias. The amplitude of this region is inversely proportional to the tunneling resistance between the tip and sample. It is possible that this can be explained in terms of Josephson effects with the films, although an alternative is given based on electronic self-energy corrections. Data showing capacitive charging steps are analyzed in terms of two ultrasmall tunnel junctions in series.

Research Organization:
Michigan Univ., Ann Arbor, MI (USA). Center for High Frequency Microelectronics
OSTI ID:
5809484
Report Number(s):
AD-A-230830/2/XAB; CNN: DAAL03-87-K-0007
Resource Relation:
Other Information: Pub. in Physical Review B, v41 n13 p8904-8911, 1 May 90
Country of Publication:
United States
Language:
English