Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Process research on polycrystalline-silicon material (PROPSM). Quarterly report No. 10, April 1, 1983 - June 30, 1983

Technical Report ·
DOI:https://doi.org/10.2172/5796560· OSTI ID:5796560
The investigation of the performance-limiting mechanisms in large-grain (greater than 1 to 2 mm in diameter) polycrystalline silicon was continued by measuring the illuminated current-voltage (I-V) characteristics of the mini-cell wafer set. Low average values of open-circuit voltage and a great degree of open-circuit voltage and fill-factor scatter were correlated with the presence of inclusions, which was also correlated with significantly greater values of shunt conductance. Therefore, the scatter in the open-circuit voltage, fill-factor and power of solar cells presently fabricated from cast large-grain polycrystalline silicon is due, to some extent, to inclusions, which act as resistive shunts. However, this defect is not intrinsic since a number of polycrystalline wafers shown no indication of excessive shunt conductance or the presence of inclusions. Two processes, gettering and hydrogenation, are being investigated for improving the performance of polycrystalline silicon. Several experiments were performed to evaluate the usefulness of a 1000/sup 0/C back-side damage-gettering heat treatment for removing minority-carrier lifetime-killing impurities. At present, no improvement in minority-carrier lifetime has been observed. The photoconductivity decay time of the polycrystalline silicon wafers was systematically and significantly degraded by longer heat-treatments at 1000/sup 0/C. There appears to be a minority-carrier lifetime-killing mechanism in polycrystalline silicon that is activated by the high temperatures employed in this particular damage-gettering heat treatment. A system for DC plasma hydrogenation of 2 cm x 2 cm samples is being refurbished to investigate grain and subgrain boundary passivation.
Research Organization:
Solarex Corp., Rockville, MD (USA)
DOE Contract Number:
NAS-7-100-955902
OSTI ID:
5796560
Report Number(s):
DOE/JPL/955902-83/10; ON: DE83016820
Country of Publication:
United States
Language:
English