A simple interferometric method for monitoring mode hopping in tunable external-cavity semiconductor lasers

Journal Article · Sun Jan 01 04:00:00 EST 1989 · J. Lightwave Technol.; (United States)

DOI:https://doi.org/10.1109/50.17735· OSTI ID:5774455

Ohtsu, M; Liou, K Y; Burrows, E C; Burrus, C A; Eisenstein, G

A problem in frequency tuning of external-cavity lasers is mode hopping between neighboring external cavity modes. An interferometric method is proposed for monitoring mode hopping in external-cavity semiconductor lasers. The mode-hopping events in a 1.3-/mu/m grating-tuned external-cavity laser were analyzed using this method. The average frequency of mode hopping for a 7.5-cm external-cavity length was estimated and was expressed as f/sub c/ = 2.7 x 10/sup 6/ x exp (-1.7/(I/I/sub th/ - 1)) (hertz) for 0.07 /le/ (I/I/sub th/ - 1) /le/ 0.8 (I = injection current and I/sub th/ = threshold current). The mode-hopping monitoring signal was negatively fed back to the laser using an automatic control circuit which maintained single-mode operation while the wavelength of the grating external-cavity laser was tuned.

• Research Organization: AT and T Bell Labs., Holmdel, NJ (USA)
• OSTI ID: 5774455
• Journal Information: J. Lightwave Technol.; (United States), Journal Name: J. Lightwave Technol.; (United States) Vol. 7:1; ISSN JLTED
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING
420300* -- Engineering-- Lasers-- (-1989)
DATA ANALYSIS
DESIGN
FREQUENCY MODULATION
GRATINGS
INTERFEROMETRY
LASERS
MODE LOCKING
MODULATION
MONITORING
PERFORMANCE
SEMICONDUCTOR DEVICES
SEMICONDUCTOR LASERS
SOLID STATE LASERS
WAVELENGTHS