Means and method for determining residual stress on a polycrystalline sample by x-ray diffraction
Patent
·
OSTI ID:5769472
A polycrystalline sample is irradiated with a collimated beam of substantially monochromatic X-ray radiation to form a diffraction come which extends and expands outwardly from the sample. A substantially planar, two-dimensional, position sensitive detector is disposed across the cone to intercept and thereby form a two-dimensional image of at least a substantial portion of the cone's cross-sectional periphery. A theoretical relationship exists between the shape of the cone's image and the residual stress in the sample such that the image can be analyzed to quantitatively determine the residual stress.
- Assignee:
- Science Applications, Inc.
- Patent Number(s):
- US 4489425
- OSTI ID:
- 5769472
- Resource Relation:
- Patent File Date: Filed date 14 Jan 1983; Other Information: PAT-APPL-453809
- Country of Publication:
- United States
- Language:
- English
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