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Microscopic observation of interface structures of YBaCuO/MgO/YBaCuO double-heteroepitaxial thin films by TEM

Conference · · IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States)
OSTI ID:5767469
; ;  [1]; ;  [2]
  1. Osaka Univ. (Japan)
  2. Yokohama R and D Lab., Furukawa Electric Co., Ltd., Nishi-ku, Yokohama 220 (JP)
The authors of this paper have fabricated the YBaCuO/MgO/YBaCuO double-heterostructure (DHS) using conventional rf magnetron sputtering. The formation of (110) YBaCuO/(100)MgO/(110)YBaCuO on (110)SrTiO{sub 3} substrate, and (001)YBaCuO/(100)MgO/(100)YBaCuO and (001) YBaCuO/ (100)MgO/(001)YBaCuO on (100)MgO substrate are demonstrated. According to the RHEED observations, each layer of the DHS was grown epitaxially. The cross sectional TEM observation of the (001)YBaCuO/(100)MgO(2nm)/(001)YBaCuO structure was carried out for characterizations of the heterostructures. The ultra-thin MgO layer grew island-shape. The MgO island formation was continuing and stimulated much more along with the top YBaCuO growth. The YBaCuO atomic arrange shape implied that the YBaCuO growth mechanism was the so-called atomic layer epitaxy.
OSTI ID:
5767469
Report Number(s):
CONF-900944--
Conference Information:
Journal Name: IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States) Journal Volume: 27:2
Country of Publication:
United States
Language:
English