Failure modes of laminate structures

Conference · Mon Jun 01 04:00:00 EDT 1987

OSTI ID:5761941

Gordon, L B; Druce, R L; Wilson, M J

Laminate structures composed of alternating thin layers of conductor and dielectric material are commonly used in energy storage and transmission components. The failure of the dielectric layers in regions of high field stress, with applied 60 Hz ac, dc and impulse voltages, was studied. Several geometries were compared, including staggered and flush edges. Electrical trees developed between the laminated dielectric layers. The visual characteristics and growth rates of the electrical trees under ac, dc and impulse stresses were different. Partial discharge detection and analysis was used to measure the inception voltage and discharge activity at the conductor edge voids, to observe tree formation and growth, and to predict impending failure due to dielectric erosion. Electric field distributions were modeled and partial discharge inception levels were estimated from known void geometries. The staggered edge geometry appears to enhance the electric field stress at the recessed electrode.

• Research Organization: Lawrence Livermore National Lab., CA (USA); Auburn Univ., AL (USA). Space Power Inst.
• DOE Contract Number: W-7405-ENG-48
• OSTI ID: 5761941
• Report Number(s): UCRL-96205; CONF-870656-48; ON: DE88002579
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360603* -- Materials-- Properties
COMPOSITE MATERIALS
COPPER
DIELECTRIC MATERIALS
ELECTRIC CONDUCTORS
ELECTRIC DISCHARGES
ELEMENTS
MATERIALS
METALS
TRANSITION ELEMENTS