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Electronic effects in scanning tunneling microscopy: Moire pattern on a graphite surface

Journal Article · · Physical Review, B: Condensed Matter; (United States)
;  [1]
  1. Physics Department, Brookhaven National Laboratory, Upton, New York 11973 (United States)
We observed by scanning tunneling microscopy (STM) a hexagonal superlattice on graphite with a period of 66 A. Direct measurement of the angle between lattice vectors confirmed that the superlattice is a Moire pattern caused by a 2.1[degree] rotation of the topmost (0001) plane with respect to the bulk. The STM corrugation of 2.6 A is not due to physical buckling, but to differences in electronic structure between [ital AA]-stacked, normal [ital AB]-stacked, and rhombohedral [ital CAB]-stacked graphite. The high tunneling current of [ital AA]-stacked regions is in agreement with the high density of states at the Fermi level calculated for [ital AA] graphite. The Moire pattern changes, both the amplitude and the shape, with bias voltage. The observation provides a basis for a comparative study of surface electronic structures with different subsurface layer configuration, which is a vital test of our understanding of STM.
DOE Contract Number:
AC02-76CH00016
OSTI ID:
5741433
Journal Information:
Physical Review, B: Condensed Matter; (United States), Journal Name: Physical Review, B: Condensed Matter; (United States) Vol. 48:23; ISSN PRBMDO; ISSN 0163-1829
Country of Publication:
United States
Language:
English