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Electrical resistivity and thermal expansion of La/sub 1-x/Ce/sub x/Sn/sub 3/ and CeIn/sub 3-y/Sn/sub y/

Journal Article · · J. Appl. Phys.; (United States)
DOI:https://doi.org/10.1063/1.326848· OSTI ID:5740861
We have measured the temperature dependence of the electrical resistivity and thermal expansion of La/sub 1-x/Ce/sub x/Sn/sub 3/, CeSn/sub 2/In and LaSn/sub 2/In from 300K to 1.5K. The CeSn/sub 3/ system is interesting because a variety of previous measurements seem to suggest that the Ce ions within this system may display intermediate valence behavior. Both the thermal expansion measurements and resistivity data for these systems are presented and compared to both other known mixed valence systems and predictions for concentrated Kondo systems.
Research Organization:
Department of Physics, Temple University, Philadelphia, Pa. 19122
OSTI ID:
5740861
Journal Information:
J. Appl. Phys.; (United States), Journal Name: J. Appl. Phys.; (United States) Vol. 50:B11; ISSN JAPIA
Country of Publication:
United States
Language:
English