In situ extended x-ray absorption fine structure spectroscopy of thin-film nickel hydroxide electrodes
- General Motors Research Laboratories, Warren, Michigan 48090 (US)
- Department of Physics, Case Western Reserve University, Cleveland, Ohio 44106 (USA)
A convenient {ital in} {ital situ} electrochemical cell has been developed which permits x-ray absorption measurements on thin-film electrodes under electrochemical polarization. Extended x-ray absorption fine structure spectra from highly disordered {alpha}-Ni(OH){sub 2} films, before and after polarization, provided quantitative results on the lattice contraction accompanying oxidation. Upon oxidation of {alpha}-Ni(OH){sub 2}, the Ni-O distance contracted from 2.05 to 1.86 A, and the Ni-Ni distance contracted from 3.09 to 2.82 A. The observed 10% contraction in the brucite plane is consistent with the 3.67 nickel valence in a K(NiO{sub 2}){sub 3} phase. The present technique extends x-ray absorption spectroscopy to the study of a variety of unstable materials not amenable to {ital ex} {ital situ} techniques.
- DOE Contract Number:
- AC02-76CH00016
- OSTI ID:
- 5733544
- Journal Information:
- Applied Physics Letters; (USA), Journal Name: Applied Physics Letters; (USA) Vol. 58:8; ISSN APPLA; ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
400102* -- Chemical & Spectral Procedures
400400 -- Electrochemistry
ABSORPTION SPECTRA
CHEMICAL REACTIONS
ELECTROCHEMICAL CELLS
ELECTRODES
FINE STRUCTURE
HYDROGEN COMPOUNDS
HYDROXIDES
NICKEL COMPOUNDS
NICKEL HYDROXIDES
OXIDATION
OXYGEN COMPOUNDS
SPECTRA
TRANSITION ELEMENT COMPOUNDS
X-RAY SPECTRA