Variable angle x-ray photoelectron spectroscopy and ion scattering spectroscopy study of the Ag/SiO/sub 2/ interface
Thin Ag films of up to one monolayer on high purity fused silica have been investigated using variable angle x-ray photoelectron spectroscopy (XPS) and ion scattering spectroscopy (ISS). Silvered samples were prepared using the wet chemical process without reducers or by vacuum evaporation. After sensitization with a tin complex, it was determined from ISS that Sn is a surface species only and covers up to 30% of Si surface sites. Variable angle XPS verified these findings and suggested that the Sn is located above the Si surface plane. After silvering with the wet chemical process so that less than a monolayer of Ag is present on the surface, XPS showed that up to 60% of the surface Si is bound to Ag, while 20% of the surface Si sites remain covered by a Sn complex. ISS verified that Ag is a surface species and that 80% of the surface is covered by Ag and Sn. Variable angle XPS showed that Ag is raised out of the surface plane, and that it probably also resides over the Si. Analysis of one monolayer Ag films formed by vacuum evaporation on SiO/sub 2/ show similar results. Using XPS peak positions and Auger parameter shifts, evidence was found for Ag--Si bonding. Variable angle ISS gave strong evidence of Ag residing over the Si.
- Research Organization:
- Materials Branch, Solar Energy Research Institute, Golden, Colorado 80401
- DOE Contract Number:
- AC02-83CH10093
- OSTI ID:
- 5729843
- Journal Information:
- J. Vac. Sci. Technol., A; (United States), Vol. 4:3
- Country of Publication:
- United States
- Language:
- English
Similar Records
Multilayer approach to the quantitative analysis of x-ray photoelectron spectroscopy results: Applications to ultrathin SiO{sub 2} on Si and to self-assembled monolayers on gold
Metal overlayers on organic functional groups of self-organized molecular assemblies. V. Ion scattering spectroscopy and x-ray photoelectron spectroscopy of Ag/COOH interfaces
Related Subjects
SILICA
CHEMICAL BONDS
INTERFACES
SILVER
SURFACE CONTAMINATION
SURFACE PROPERTIES
CHEMISTRY
IMPURITIES
ION SPECTROSCOPY
PHOTOELECTRON SPECTROSCOPY
SILICON
THIN FILMS
TIN
VACUUM EVAPORATION
X RADIATION
CHALCOGENIDES
CONTAMINATION
ELECTROMAGNETIC RADIATION
ELECTRON SPECTROSCOPY
ELEMENTS
EVAPORATION
FILMS
IONIZING RADIATIONS
METALS
MINERALS
OXIDE MINERALS
OXIDES
OXYGEN COMPOUNDS
PHASE TRANSFORMATIONS
RADIATIONS
SEMIMETALS
SILICON COMPOUNDS
SILICON OXIDES
SPECTROSCOPY
TRANSITION ELEMENTS
360102* - Metals & Alloys- Structure & Phase Studies
360602 - Other Materials- Structure & Phase Studies