Atomic resolution study of displacement cascades in ion-irradiated platinum

Journal Article · Tue Jul 01 04:00:00 EDT 1986 · J. Appl. Phys.; (United States)

DOI:https://doi.org/10.1063/1.337676· OSTI ID:5728317

Pramanik, D; Seidman, D N

The field-ion microscope technique has been employed to study, on an atomic scale, the vacancy structure of individual depleted zones (DZs) in platinum specimens which had been created by 20-keV Kr/sup +/ ions. DZs are the final quiescent state of collision cascades. The irradiations were performed in situ at 60 K and the specimens were examined at this temperature by the pulse field-evaporation technique. The following experimental quantities were determined for each DZ: (a) the absolute number of vacancies (..nu..); (b) the average diameter; (c) the average vacancy concentration based on ..nu.. and the actual volume filled by the vacancies; (d)= the radial distribution function of the vacancies out to the ninth nearest-neighbor; (e) the fraction of first-nearest-neighbor vacancies in clusters of size n; (f) the average depth (L) from the irradiated surface, measured along a direction parallel to the incident ion beam, at which each DZ was detected and its direction of elongation; and (g) the sputtering yield based on the number of vacancies detected in the near-surface region (<5 A thick). All of the measured quantities are compared with corresponding quantities extracted from either an analytical model or a Monte Carlo computer code (Transport of Ions in Matter: trIm) of radiation damage. We demonstrate that it is possible to transform a microscopic spatial distribution of vacancies to a continuous radiation damage profile with atomic resolution.

• Research Organization: Gould Semiconductors, Santa Clara, California 95051
• DOE Contract Number: AC02-76ER03158
• OSTI ID: 5728317
• Journal Information: J. Appl. Phys.; (United States), Journal Name: J. Appl. Phys.; (United States) Vol. 60:1; ISSN JAPIA
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360106* -- Metals &amp; Alloys-- Radiation Effects
CHARGED PARTICLES
CRYSTAL DEFECTS
CRYSTAL STRUCTURE
DAMAGE
ELEMENTS
ENERGY RANGE
ION MICROSCOPY
IONS
KEV RANGE
KEV RANGE 10-100
KRYPTON IONS
METALS
MICROSCOPY
MONTE CARLO METHOD
PHYSICAL RADIATION EFFECTS
PLATINUM
PLATINUM METALS
POINT DEFECTS
RADIATION EFFECTS
RESOLUTION
SPUTTERING
TRANSITION ELEMENTS
VACANCIES
VERY LOW TEMPERATURE