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Fine structure in the elastic and inelastic scattering of /sup 12/C + /sup 28/Si and /sup 16/O + /sup 28/Si

Journal Article · · Phys. Rev., C; (United States)
The theta/sub c.m./ = 180/sup 0/ elastic and inelastic excitation functions have been measured for the systems /sup 12/C + /sup 28/Si (27.8 < or = E/sub c.m./ < or = 31.5 MeV) and /sup 16/O + /sup 28/Si (30.0 < or = E/sub c.m./ < or = 32.7 MeV) in small steps (deltaE/sub c.m./ < 100 keV). In both systems it is observed that the gross structures previously found (GAMMA approx. = 1--2 MeV) are strongly split into finer structure. A statistical analysis of the data has been made to determine the average width, strength, and cross correlation of these narrow structures. The results are compared to the predictions of Hauser-Feshbach calculations. It is concluded that it is impossible within the standard statistical model to simultaneously reproduce both the observed widths and the average fluctuating cross sections.
Research Organization:
Brookhaven National Laboratory, Upton, New York 11973
OSTI ID:
5726565
Journal Information:
Phys. Rev., C; (United States), Journal Name: Phys. Rev., C; (United States) Vol. 20:5; ISSN PRVCA
Country of Publication:
United States
Language:
English