High-temperature-measuring device
Patent
·
OSTI ID:5708608
A temperature measuring device for very high design temperatures (to 2000/sup 0/C) is described. The device comprises a homogenous base structure preferably in the form of a sphere or cylinder. The base structure contains a large number of individual walled cells. The base structure has a decreasing coefficient of elasticity within the temperature range being monitored. A predetermined quantity of inert gas is confined within each cell. The cells are dimensonally stable at the normal working temperature of the device. Increases in gaseous pressure within the cells will permanently deform the cell walls at temperatures within the high temperature range to be measured. Such deformation can be correlated to temperature by calibrating similarly constructed devices under known time and temperature conditions.
- DOE Contract Number:
- AC06-76RL01830
- Assignee:
- Dept. of Energy
- Patent Number(s):
- None
- Application Number:
- ON: DE82004464
- OSTI ID:
- 5708608
- Country of Publication:
- United States
- Language:
- English
Similar Records
High temperature measuring device
High temperature measuring device
Method of producing thermally sprayed metallic coating
Patent
·
Fri Dec 31 23:00:00 EST 1982
·
OSTI ID:864566
High temperature measuring device
Patent
·
Tue May 31 00:00:00 EDT 1983
·
OSTI ID:6001352
Method of producing thermally sprayed metallic coating
Patent
·
Tue Aug 26 00:00:00 EDT 2003
·
OSTI ID:935565