Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Vitrification of Y zeolite and its effects on HREM images

Technical Report ·
OSTI ID:5698689
Electron diffraction has been used to study the vitrification of Y zeolite in the transmission electron microscope (TEM). Calculations and experimental evidence have confirmed that in the range 80 to 200kV, the damage of Y zeolites in radiolytic in the TEM. Incident beam electrons interact with specimen electrons which leads to a rearrangement of the structure. The proposed mechanism for this transformation involves enhancement of structural relaxation at A+ sites due to the presence of a charge compensating cation. Computer image simulation was used to assess the effects of damage on high resolution electron microscope (HREM) images of Y zeolites. Simulated images of perfect Y zeolite revealed that only for a specimen 10 to 20nm thick would the HREM image be a structure image at Scherzer defocus (-60nm); at thickness greater than 20nm the images contain non-structural detail due to second order interferences. Al larger defocus values (-100nm), thicker crystals (60nm) ''with 30 to 50% of their thickness amorphous'' produce images which can be related to the structure because the presence of the amorphous material decreases the visibility of the non-structural detail.
Research Organization:
Lawrence Berkeley Lab., CA (USA)
DOE Contract Number:
AC03-76SF00098
OSTI ID:
5698689
Report Number(s):
LBL-21640; ON: DE86013005
Country of Publication:
United States
Language:
English