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Enhanced electron attachment to superexcited states of saturated tertiary amines

Journal Article · · Journal of Chemical Physics; (USA)
DOI:https://doi.org/10.1063/1.461484· OSTI ID:5689796
; ;  [1]
  1. Atomic, Molecular, and High Voltage Group, Health and Safety Research Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 (US) Department of Physics, The University of Tennessee, Knoxville, Tennessee 37996

Electron attachment measurements on excimer--laser-excited superexcited states (SES) of saturated amine compounds, and in particular on triethylamine (TEA), have been carried out employing a new experimental technique. A rate equation analysis based on a proposed model shows that the electron attachment rate constant for the SES is several orders of magnitude larger than that for the ground electronic state. The proposed mechanism for electron attachment to SES involves the capture of a near-zero-energy electron---(produced by the same laser pulse that produces the SES)---by a superexcited molecule to form a transient parent anion which subsequently dissociates producing a stable fragment anion. The similarity of the above mechanism to an electron-excited Feshbach resonance is indicated and a scheme for the identification of molecular systems that can be excited (via resonance-enhanced multiphoton excitation) to SES is outlined.

DOE Contract Number:
AC05-84OR21400
OSTI ID:
5689796
Journal Information:
Journal of Chemical Physics; (USA), Journal Name: Journal of Chemical Physics; (USA) Vol. 95:1; ISSN JCPSA; ISSN 0021-9606
Country of Publication:
United States
Language:
English