Artifically layered superconductors. Annual progress report

Technical Report · Sat Oct 01 04:00:00 EDT 1983

OSTI ID:5687969

Falco, C M

We describe research accomplished during the first year of this contract. Several metallic superlattice systems have been prepared by sputtering techniques, structurally characterized by x-ray diffraction (both Bragg and Laue), and measurements made of their electrical transport properties. These metallic systems are found to grow with excellent structural coherence perpendicular to the layers, as evidenced by a large number of superlattice lines in the x-ray diffraction spectra. Also described in this progress are additions made to our equipment and facilities during the previous year. Our sputtering system now has microprocessor control of the substrate rotation, as well as of the sputtering rate. With these microprocessors, we are able to control the thickness of each layer of the superlattices to +-0.1%.

• Research Organization: Arizona Univ., Tucson (USA)
• DOE Contract Number: AC02-83ER45025
• OSTI ID: 5687969
• Report Number(s): DOE/ER/45025-2; ON: DE84002768
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360101* -- Metals & Alloys-- Preparation & Fabrication
656102 -- Solid State Physics-- Superconductivity-- Acoustic
Electronic
Magnetic
Optical
& Thermal Phenomena-- (-1987)
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
COHERENT SCATTERING
DIFFRACTION
ELECTRIC CONDUCTIVITY
ELECTRICAL PROPERTIES
ELEMENTS
METALS
MOLYBDENUM
NIOBIUM
PHYSICAL PROPERTIES
RESEARCH PROGRAMS
SCATTERING
SPUTTERING
SUPERCONDUCTIVITY
SUPERCONDUCTORS
SUPERLATTICES
TANTALUM
TRANSITION ELEMENTS
X-RAY DIFFRACTION