Comment on ''Determination of interface states for CaF/sub 2//Si(111) from near-edge x-ray-absorption measurements''
Journal Article
·
· Phys. Rev. Lett.; (United States)
A Comment on the Letter by F. J. Himpsel, et al., Phys. Rev. Lett. 56, 1497 (1986).
- Research Organization:
- ATandT Bell Laboratories, 600 Mountain Avenue, Murray Hill, New Jersey 07974
- OSTI ID:
- 5677805
- Journal Information:
- Phys. Rev. Lett.; (United States), Journal Name: Phys. Rev. Lett.; (United States) Vol. 60:2; ISSN PRLTA
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
36 MATERIALS SCIENCE
360603* -- Materials-- Properties
ABSORPTION
ALKALINE EARTH METAL COMPOUNDS
CALCIUM COMPOUNDS
CALCIUM FLUORIDES
CALCIUM HALIDES
COVERINGS
CRYSTALS
ELECTRICAL PROPERTIES
ELECTROMAGNETIC RADIATION
ELECTRON SPECTROSCOPY
ELEMENTS
ENERGY ABSORPTION
FLUORIDES
FLUORINE COMPOUNDS
HALIDES
HALOGEN COMPOUNDS
INTERFACES
IONIZING RADIATIONS
MONOCRYSTALS
PHOTOELECTRON SPECTROSCOPY
PHYSICAL PROPERTIES
RADIATIONS
SEMIMETALS
SILICON
SPECTROSCOPY
X RADIATION
360603* -- Materials-- Properties
ABSORPTION
ALKALINE EARTH METAL COMPOUNDS
CALCIUM COMPOUNDS
CALCIUM FLUORIDES
CALCIUM HALIDES
COVERINGS
CRYSTALS
ELECTRICAL PROPERTIES
ELECTROMAGNETIC RADIATION
ELECTRON SPECTROSCOPY
ELEMENTS
ENERGY ABSORPTION
FLUORIDES
FLUORINE COMPOUNDS
HALIDES
HALOGEN COMPOUNDS
INTERFACES
IONIZING RADIATIONS
MONOCRYSTALS
PHOTOELECTRON SPECTROSCOPY
PHYSICAL PROPERTIES
RADIATIONS
SEMIMETALS
SILICON
SPECTROSCOPY
X RADIATION