Measurement of the size dependence of the current-phase relation in microbridge Josephson junctions

Journal Article · Mon Dec 31 23:00:00 EST 1979 · Appl. Phys. Lett.; (United States)

DOI:https://doi.org/10.1063/1.91285· OSTI ID:5677787

Pei, S S; Lukens, J E; Sandell, R D

We present the first direct measurements of the size effect on the current-phase relation of microbridge Josephson junctions. The phase difference across the bridge is obtained by subtracting the phase shift of the thin-film leads from the total phase shift. We have found that the current-phase relations are sinusoidal for both uniform and variable thickness bridges with dimensions much smaller than xi (T). For narrow uniform thickness bridges with width very-much-less-thanxi (T), the measured length dependence of the current-phase relation is in good agreement with the calculation of Likharev and Yakobson for variable thicknes bridges.

• Research Organization: Department of Physics, State University of New York, Stony Brook, New York 11794
• OSTI ID: 5677787
• Journal Information: Appl. Phys. Lett.; (United States), Journal Name: Appl. Phys. Lett.; (United States) Vol. 36:1; ISSN APPLA
• Country of Publication: United States
• Language: English

Related Subjects

420201* -- Engineering-- Cryogenic Equipment & Devices
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
COMPARATIVE EVALUATIONS
CURRENTS
DATA
DIMENSIONS
ELECTRIC BRIDGES
ELECTRIC CURRENTS
ELECTRICAL EQUIPMENT
EQUIPMENT
FILMS
INFORMATION
JOSEPHSON JUNCTIONS
MATHEMATICAL MODELS
PHASE SHIFT
SUPERCONDUCTING JUNCTIONS
THICKNESS