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Electron-beam diagnostics in nitrogen. Secondary processes

Journal Article · · Sov. Phys. - Tech. Phys. (Engl. Transl.); (United States)
OSTI ID:5670874
The problems connected with electron-beam diagnostics of nitrogen are discussed. It is established that the excitation of the N/sup +//sub 2/B/sup 2/..sigma../sup +//sub u/ state and the emission of the first negative system (1 NS) of N/sub 2/ bands are caused by primary and fast secondary electrons. It is shown that the ionization of nitrogen in the N/sup +//sub 2/B/sup 2/..sigma../sup +//sub u/ state by secondary electrons takes place with a larger change in the rotational quantum number than for ionization by fast primary electrons. The distribution function of the secondary electrons and their contribution to the emission intensity of the 1 NS excited by a diagnostic electron beam are determined using the linearized integral Boltzmann equation. The experimental and calculated emission intensities are compared and good agreement is obtained.
Research Organization:
Institute of Thermophysics, Siberian Branch of the Academy of Sciences of the USSR, Novosibirsk
OSTI ID:
5670874
Journal Information:
Sov. Phys. - Tech. Phys. (Engl. Transl.); (United States), Journal Name: Sov. Phys. - Tech. Phys. (Engl. Transl.); (United States) Vol. 26:9; ISSN SPTPA
Country of Publication:
United States
Language:
English