Role of atmospheric corrosion of aluminum alloys in viability of intrinsic-surface methods for tagging military hardware

Technical Report · Fri Nov 01 04:00:00 EST 1991

DOI:https://doi.org/10.2172/5660635· OSTI ID:5660635

Maiya, P S; Kassner, T F

A primary requirement for authentication of tags for military equipment desigated as treaty-limited items (TLIs) is that the surface topograhy of the tag area be maintained after exposure to a variety of atmospheric conditions over many years. This report summarizes the chemical and physical properties of atmospheric as they relate to localized corrosion of aluminum and aluminum alloys. The role of impurity species that exacerbate corrison, and that hence may interfere with tag verification, is discussed. Because exposure times for the tag materials are much longer than those practical in laboratory experiments, it is important to understand the kinetics of processes occurring in these alloys and the viability of various protection schemes. General principles and limitations of testing in natural atmospheres and in the laboratory are discussed. Corrosion results indicate that the tag surface must be protected, and a tag protection scheme is proposed.

• Research Organization: Argonne National Lab., IL (United States)
• Sponsoring Organization: DOE; USDOE, Washington, DC (United States)
• DOE Contract Number: W-31109-ENG-38
• OSTI ID: 5660635
• Report Number(s): ANL/ACTV-91/6; ON: DE92009925
• Country of Publication: United States
• Language: English

Related Subjects

350300* -- Arms Control-- Verification-- (1987-)
36 MATERIALS SCIENCE
360105 -- Metals & Alloys-- Corrosion & Erosion
98 NUCLEAR DISARMAMENT, SAFEGUARDS, AND PHYSICAL PROTECTION
ALLOYS
ALUMINIUM
ALUMINIUM ALLOYS
ARMS CONTROL
ATMOSPHERIC CHEMISTRY
CHALCOGENIDES
CHEMICAL REACTION KINETICS
CHEMICAL REACTIONS
CHEMISTRY
COATINGS
CORROSION
ELECTRON MICROSCOPY
ELEMENTS
HYDROGEN COMPOUNDS
HYDROXIDES
INSPECTION
KINETICS
METALS
MICROSCOPY
OXIDES
OXYGEN COMPOUNDS
PITTING CORROSION
PROTECTIVE COATINGS
REACTION KINETICS
SCANNING ELECTRON MICROSCOPY
VERIFICATION
WATER