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Critical currents and scaling laws in sputtered PbMo/sub 6plus-or-minusx/ S/sub 8-y/ thin films

Journal Article · · J. Low Temp. Phys.; (United States)
DOI:https://doi.org/10.1007/BF00655055· OSTI ID:5659124
Thin films with the Chevrel-phase structure were deposited using a dc getter sputtering method from targets with composition PbMo/sub 5.1/S/sub 6/ and PbMo/sub 6.35/S/sub 8/, respectively. Critical parameters as T/sub c/, (dB/dT)/sub T//sub c/, and J/sub c/ vs. B and T wee measured. Based on the J/sub c/(B,T) relation it was possible to show that the pinning forces P/sub v/ with respect to the reduced magnetic field b = B/B/sub c/2 have the form b/sup 1/2/(1-b)/sup 2/ for samples prepared from the target with the composition PbMo/sub 5.1/S/sub 6/ and b(1-b)/sup 2/ for samples prepared from the target with the composition PbMo/sub 6.35/S/sub 8/. It is suggested that some of MoS/sub 2/ phase is responsible for pinning centers in the first set of samples This MoS/sub 2/ phase was indicated by x-ray diffraction. For the second set of samples it is supposed that point-type defects are the pinning centers.
Research Organization:
Institute for Low Temperature and Structure Research, Polish Academy of Sciences, Wroclaw, Poland
OSTI ID:
5659124
Journal Information:
J. Low Temp. Phys.; (United States), Journal Name: J. Low Temp. Phys.; (United States) Vol. 46:3; ISSN JLTPA
Country of Publication:
United States
Language:
English