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Double ionization of helium by photons and charged particles

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.52257· OSTI ID:565415
;  [1]; ;  [2]
  1. Department of Physics, University of Tennessee, Knoxville, Tennessee 379961200 (United States of America)
  2. Department of Physics, Tulane University, New Orleans, Louisiana 70118 (United States)

We discuss double ionization of helium by charged particles, photoionization, and Compton scattering. With the help of an analysis of the cross section as a function angular momentum transfer (partial waves) or momentum transfer, distant Coulomb collisions can be related to photoionization while hard Coulomb collisions can be related to Compton scattering. Within this framework, accurate tests for recent photoionization and charged-particle data are possible. We also study the behavior of the differential Compton and charged particle cross sections at high energies and show that beyond the binary encounter limit all processes approach the photoionization limit. {copyright} {ital 1997 American Institute of Physics.}

Research Organization:
Oak Ridge National Laboratory
Sponsoring Organization:
USDOE
DOE Contract Number:
AC05-96OR22464
OSTI ID:
565415
Report Number(s):
CONF-9609283--
Journal Information:
AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 389; ISSN 0094-243X; ISSN APCPCS
Country of Publication:
United States
Language:
English

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