A fault identification algorithm for t/sub I/-diagnosable systems
Journal Article
·
· IEEE Trans. Comput.; (United States)
In this paper, a new approach to identifying faulty units in t/sub I/-diagnosable systems is described. This approach exploits special properties of the highly structured t/sub I/-diagnosable systems to produce a faulty unit identification algorithm which is shown to be of time complexity O(absolute value of E) where absolute value of E corresponds to the number of tests in the system. The diagnosis quality of the algorithm is as follows: 1) if the algorithm identifies a unit as faulty, it is always correct; 2) if the collection of test outcomes takes on a form that is compatible with a permanent fault situation, the algorithm identifies all of the corresponding faulty units; and 3) the algorithm identifies at least one faulty unit over collections of test outcomes significantly larger than those that are compatible with permanent fault situations.
- Research Organization:
- Dept. of Electrical Engineering and Computer Science, Johns Hopkins Univ., Baltimore, MD 21218
- OSTI ID:
- 5652778
- Journal Information:
- IEEE Trans. Comput.; (United States), Journal Name: IEEE Trans. Comput.; (United States); ISSN ITCOB
- Country of Publication:
- United States
- Language:
- English
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