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Title: Relationship between the Out-Of-Plane Resistance and the Subgap Resistance of Intrinsic Josephson Junctions in Bi{sub 2}Sr{sub 2}CaCu{sub 2}O{sub 8 +{ital {delta}}}

Journal Article · · Physical Review Letters
; ;  [1]; ;  [2]
  1. Department of Microelectronics and Nanoscience, Chalmers University of Technology, S-41296, Goeteborg (Sweden)
  2. P.L. Kapitza Institute for Physical Problems, ul.Kosygina 2, Moscow, 117334 (Russia)

We have experimentally demonstrated that the c-axis magnetoresistance peak effect is determined by the subgap resistance of intrinsic Josephson junctions in Bi{sub 2}Sr{sub 2}CaCu{sub 2}O{sub 8+{delta}} (Bi2212). Given a Bi2212 single crystal, the effect may be predicted from the c-axis current-voltage (I-V) characteristics in {ital zero} magnetic field. At high magnetic field H, the I-V characteristics preserve their overall nonlinear shape at the transition temperature T{sub c}(H){le}T{sub c}(0) suggesting a smooth change of the vortex system with temperature. Observation of the gap feature below T{sub c}(0) at all {mu}{sub 0}H{le}7 T means that the upper critical field is not attained at these fields. {copyright} {ital 1997} {ital The American Physical Society}

OSTI ID:
565238
Journal Information:
Physical Review Letters, Vol. 79, Issue 25; Other Information: PBD: Dec 1997
Country of Publication:
United States
Language:
English