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Resistance measurements and vortex fluctuations in two-dimensional superconducting films

Journal Article · · J. Low Temp. Phys.; (United States)
DOI:https://doi.org/10.1007/BF00682448· OSTI ID:5652225

Recently theories of vortex fluctuations in two-dimensional superconducting films have been compared to the experimentally determined power law dependence of voltage on current and to the temperature-dependent resistance in small applied fields. Here an alternative interpretation of the power law and a practical difficulty of flux pinning for measurements in small fields are pointed out. To illustrate these points, experimental examples are presented for very homogeneous granular aluminum films.

Research Organization:
Materials Science and Technology Division, Argonne National Laboratory, Argonne, Illinois
OSTI ID:
5652225
Journal Information:
J. Low Temp. Phys.; (United States), Journal Name: J. Low Temp. Phys.; (United States) Vol. 59:5; ISSN JLTPA
Country of Publication:
United States
Language:
English