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Self-diffusion of Er in pure and HfO/sub 2/-doped polycrystalline Er/sub 2/O/sub 3/

Conference · · J. Am. Ceram. Soc.; (United States)
OSTI ID:5643345
Using a tracer sectioning technique, the self-diffusion of Er in pure and HfO/sub 2/-doped polycrystalline Er/sub 2/O/sub 3/ was measured at 1614 to 1900/sup 0/C. Up to approx. = 10 mol % HfO/sub 2/ dopant level, the Er self-diffusion coefficients followed a relation based on cation vacancies as the principal mobile defects present and available for cation diffusion. Above 10 mol % HfO/sub 2/, deviation from this relation occurred, apparently due to clustering of cation vacancies and oxygen interstitials around the dopant hafnium ions. The activation energy for the self-diffusion of Er in pure Er/sub 2/O/sub 3/ was 82.2 kcal/mol and increased with the HfO/sub 2/ dopant level present.
Research Organization:
Iows State Univ., Ames
DOE Contract Number:
W-7405-ENG-82
OSTI ID:
5643345
Conference Information:
Journal Name: J. Am. Ceram. Soc.; (United States) Journal Volume: 62:9-10
Country of Publication:
United States
Language:
English