Characteristics of a freely programmable ICCD detector for multichord particle influx measurements on the ASDEX-Upgrade tokamak
Journal Article
·
· Review of Scientific Instruments; (United States)
- Max-Planck-Institut fuer Plasmaphysik, D-8046 Garching (Germany)
The characteristics of a compact space and wavelength-resolving spectrometer-detector arrangement are described which is used to measure spectral line shapes simultaneously along several viewing chords. The system is based upon a freely programmable slow-scan charge-coupled device (CCD) camera gated by an image intensifier tube. Visible and near-UV light emitted near the plasma boundary is collected from up to 12 viewing chords and transmitted to the spectrograph by quartz fibers. Spectra can be recorded with a temporal resolution of 20 ms by means of multiple pixel binning during CCD readout. Integration of the spectral line profiles yield particle fluxes of various low-[ital Z] species for ohmically heated helium discharges. The calibration, sensitivity, and signal-to-noise ratio of the system are reconstructed considering each individual element, allowing an easy prediction of the performance of similar applications.
- OSTI ID:
- 5641697
- Journal Information:
- Review of Scientific Instruments; (United States), Journal Name: Review of Scientific Instruments; (United States) Vol. 64:5; ISSN 0034-6748; ISSN RSINAK
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
70 PLASMA PHYSICS AND FUSION TECHNOLOGY
700320* -- Plasma Diagnostic Techniques & Instrumentation-- (1992-)
ASDEX TOKAMAK
CALIBRATION
CHARGE-COUPLED DEVICES
CLOSED PLASMA DEVICES
MEASURING INSTRUMENTS
OPERATION
PERFORMANCE
PLASMA DIAGNOSTICS
SEMICONDUCTOR DEVICES
SENSITIVITY
SIGNAL-TO-NOISE RATIO
SPECTROMETERS
THERMONUCLEAR DEVICES
TOKAMAK DEVICES
ULTRAVIOLET SPECTROMETERS
700320* -- Plasma Diagnostic Techniques & Instrumentation-- (1992-)
ASDEX TOKAMAK
CALIBRATION
CHARGE-COUPLED DEVICES
CLOSED PLASMA DEVICES
MEASURING INSTRUMENTS
OPERATION
PERFORMANCE
PLASMA DIAGNOSTICS
SEMICONDUCTOR DEVICES
SENSITIVITY
SIGNAL-TO-NOISE RATIO
SPECTROMETERS
THERMONUCLEAR DEVICES
TOKAMAK DEVICES
ULTRAVIOLET SPECTROMETERS