Analysis of frictional-force image patterns of a graphite surface
Journal Article
·
· Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena
- Department of Physics, Graduate School of Science, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113 (Japan)
- Mechanical Engineering Laboratory, Namiki 1-2, Tsukuba, Ibaragi 305 (Japan)
- Department of Electronic Engineering, Faculty of Engineering, Osaka University, 2-1 Yamadagaoka, Suita-shi, Osaka 565 (Japan)
- Department of Physics, Faculty of Science, Ochanomizu University, 2-1-1 Ohtsuka, Bunkyo-ku, Tokyo 112 (Japan)
We discuss the mechanism of image patterns of the frictional-force microscopy (FFM) of a graphite surface by using a three-dimensional model comprised of a tip connected to a cantilever and a substrate surface. A simulated FFM image is in good agreement with an experimental one. A stable domain of the tip atom position can be defined in an analytic way. In the frictional-force regime, more than one quasistable tip atom position are mapped into a single cantilever basal position. Part of the boundary of the two-dimensional domain of the cantilever basal position appears as a fringe between the bright and the dark areas along the scan direction of the FFM image. General features of FFM images can be completely understood by this analysis. {copyright} {ital 1997 American Vacuum Society.}
- OSTI ID:
- 562929
- Report Number(s):
- CONF-9609426--
- Journal Information:
- Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena, Journal Name: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena Journal Issue: 4 Vol. 15; ISSN 0734-211X; ISSN JVTBD9
- Country of Publication:
- United States
- Language:
- English
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