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Analysis of frictional-force image patterns of a graphite surface

Journal Article · · Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena
DOI:https://doi.org/10.1116/1.589479· OSTI ID:562929
;  [1];  [2]; ;  [3];  [4]
  1. Department of Physics, Graduate School of Science, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113 (Japan)
  2. Mechanical Engineering Laboratory, Namiki 1-2, Tsukuba, Ibaragi 305 (Japan)
  3. Department of Electronic Engineering, Faculty of Engineering, Osaka University, 2-1 Yamadagaoka, Suita-shi, Osaka 565 (Japan)
  4. Department of Physics, Faculty of Science, Ochanomizu University, 2-1-1 Ohtsuka, Bunkyo-ku, Tokyo 112 (Japan)
We discuss the mechanism of image patterns of the frictional-force microscopy (FFM) of a graphite surface by using a three-dimensional model comprised of a tip connected to a cantilever and a substrate surface. A simulated FFM image is in good agreement with an experimental one. A stable domain of the tip atom position can be defined in an analytic way. In the frictional-force regime, more than one quasistable tip atom position are mapped into a single cantilever basal position. Part of the boundary of the two-dimensional domain of the cantilever basal position appears as a fringe between the bright and the dark areas along the scan direction of the FFM image. General features of FFM images can be completely understood by this analysis. {copyright} {ital 1997 American Vacuum Society.}
OSTI ID:
562929
Report Number(s):
CONF-9609426--
Journal Information:
Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena, Journal Name: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena Journal Issue: 4 Vol. 15; ISSN 0734-211X; ISSN JVTBD9
Country of Publication:
United States
Language:
English

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