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InGaAs vertical-cavity surface-emitting lasers

Journal Article · · IEEE Journal of Quantum Electronics (Institute of Electrical and Electronics Engineers); (United States)
DOI:https://doi.org/10.1109/3.89952· OSTI ID:5627409
; ;  [1]
  1. Dept. of Electrical and Computer Engineering, Univ. of California, Santa Barbara, CA (US)

In this paper the authors give theoretical and experimental results for vertical-cavity surface-emitting lasers (VCSEL's). The modeling is applied to the design of InGaAs VCSEL's A simple method is introduced to calculate the reflectivity of semiconductor stack mirrors with graded interfaces and compound metal/semiconductor stack mirrors. The theoretical predictions are compared to results from actual device measurements. A novel technique is introduced to determine material parameters: fabrication of in-plane lasers from VCSEL material. The procedure used to determine the optical model in such an in-plane laser is described. Using the insight gained from our modeling, we have increased our external efficiency to {gt}30% with a threshold current density of 1 kA/cm{sup 2}. Linewidth measurements on very high reflectivity VCSEL's have indicated widths as low as 85 MHz and linewidth-power products of 5 MHz {center dot} mW.

OSTI ID:
5627409
Journal Information:
IEEE Journal of Quantum Electronics (Institute of Electrical and Electronics Engineers); (United States), Journal Name: IEEE Journal of Quantum Electronics (Institute of Electrical and Electronics Engineers); (United States) Vol. 27:6; ISSN 0018-9197; ISSN IEJQA
Country of Publication:
United States
Language:
English