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Surface resistance of bulk and thick film YBa sub 2 Cu sub 3 O sub x

Conference · · IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States)
OSTI ID:5620712
;  [1];  [2]; ;  [3];  [4]; ;  [5];  [6]
  1. ICI Advanced Materials, P.O. Box 11, The Heath, Runcorn, Cheshire WA7 4QE (GB)
  2. AT and T Bell Labs., Murray Hill, NJ (United States)
  3. Dept. of Electrical and Electronic Engineering, UMIST, Manchester M6O 1QD (GB)
  4. Liverpool Univ. (United Kingdom). Dept. of Physics
  5. Birmingham Univ. (United Kingdom)
  6. National Physical Lab., Teddington (United Kingdom)

The surface resistance, R{sub s}, of high temperature oxide superconductors (HTS) varies as f{sup n}, where f is frequency and the exponent n varies generally between 1 and 2. The R{sub s} of copper varies approximately as f{sup 1/2}. The crossover frequency, fc, between copper and HTS is a convenient indicator of sample quality in radio- frequency and microwave applications, the goal being as high a crossover frequency as possible. The R{sub s} of YBa{sub 2}Cu{sub 3}O{sub 7} (YBCO) has been measured by a coaxial method i.e. a copper outer shield and a HTS central conductor and also by using an all-YBCO TE{sub 011} cavity. The microstructure of the ceramic has been deliberately altered so that variables such as starting powder size and phase purity, ceramic density, phase composition, grain size and number of grain boundaries may be evaluated. A number of experiments have been conducted so that the variables chosen might be studied independently. The results show that R{sub s} varies in a complex manner according to the microstructure and that as sintered grain size is reduced to a certain size that R{sub s} is reduced. Further decreases in grain size are associated with an increase in the R{sub s} suggesting that grain boundary detritus and grain boundaries themselves are sources of loss. In this paper examples are given to show that R{sub s} diminishes in c-axis oriented YBCO thick films.

OSTI ID:
5620712
Report Number(s):
CONF-900944--
Journal Information:
IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States), Journal Name: IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States) Vol. 27:2; ISSN IEMGA; ISSN 0018-9464
Country of Publication:
United States
Language:
English