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Measurement of T 20 in Elastic Electron-Deuteron Scattering

Journal Article · · Physical Review Letters
 [1];  [2];  [1];  [3];  [4];  [2];  [5];  [1];  [6];  [7];  [8];  [1];  [1];  [1];  [1];  [2];  [1];  [1];  [1];  [9]
  1. Nationaal Instituut voor Kernfysica en Hoge-Energie Fysica (Nikhef), Amsterdam (Netherlands)
  2. Arizona State Univ., Tempe, AZ (United States)
  3. Nationaal Instituut voor Kernfysica en Hoge-Energie Fysica (Nikhef), Amsterdam (Netherlands); Vrije Univ., Amsterdam (Netherlands)
  4. Vrije Univ., Amsterdam (Netherlands)
  5. Thomas Jefferson National Accelerator Facility (TJNAF), Newport News, VA (United States); Hampton Univ., Hampton, VA (United States)
  6. Univ. of Virginia, Charlottesville, VA (United States)
  7. Nationaal Instituut voor Kernfysica en Hoge-Energie Fysica (Nikhef), Amsterdam (Netherlands); Thomas Jefferson National Accelerator Facility (TJNAF), Newport News, VA (United States); Univ. of Virginia, Charlottesville, VA (United States)
  8. Eidgenoessische Technische Hochschule (ETH), Zurich (Switzerland)
  9. Univ. of Wisconsin, Madison, WI (United States)

The authors report on a measurement of the tensor analyzing power $$T$$20 in elastic electron-deuteron scattering in the range of four-momentum transfer from 1.8 to $3.2fm$-1. Electrons of 704 MeV were scattered from a polarized deuterium internal target. Further, the tensor polarization of the deuterium nuclei was determined with an ion-extraction system, allowing an absolute measurement of $$T$$20. The data are described well by a non-relativistic calculation that includes the effects of meson-exchange currents.

Research Organization:
Thomas Jefferson National Accelerator Facility (TJNAF), Newport News, VA (United States)
Sponsoring Organization:
USDOE Office of Science (SC); National Science Foundation (NSF)
Grant/Contract Number:
AC05-84ER40150
OSTI ID:
5618514
Alternate ID(s):
OSTI ID: 754023
Report Number(s):
DOE/ER/40150-1334; JLAB-PHY--99-02
Journal Information:
Physical Review Letters, Journal Name: Physical Review Letters Journal Issue: 19 Vol. 82; ISSN 0031-9007
Publisher:
American Physical Society (APS)Copyright Statement
Country of Publication:
United States
Language:
English

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