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Characterization and reduction of prompt electrical noise on the Saturn PRS x-ray simulator

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.50773· OSTI ID:561834
;  [1];  [1]
  1. Ktech Corporation, 901 Pennsylvania NE, Albuquerque, New Mexico 87110 (United States)

Experiments have been conducted to identify and characterize the source of prompt electrical noise observed on piezoelectric sensor data traces recorded at the Saturn soft x-ray source. The amplitude of this noise spike often exceeded the amplitude of the signal of interest. Although the noise duration was short (50 to 100 ns), it interfered with many measurements of soft x-ray induced material response detected with piezoelectric gauges. The noise spike can be due to a combination of sources, including bremsstrahlung radiation. However, it was determined that high-energy electrons generated about 90 per cent of the recorded signal in the near-source region. Fixtures employing permanent magnets reduced the noise spike amplitude by more than a factor of ten, permitting sensitive, high-fidelity, material response measurements to be made with greater accuracy and confidence. Furthermore the test environment is more accurately controlled and defined. {copyright} {ital 1996 American Institute of Physics.}

OSTI ID:
561834
Report Number(s):
CONF-950846--
Journal Information:
AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 370; ISSN 0094-243X; ISSN APCPCS
Country of Publication:
United States
Language:
English