Sensitivity analysis of surface structure determination by low energy electron diffraction
Journal Article
·
· J. Chem. Phys.; (United States)
The determination of surface structures by low energy electron diffraction (LEED) has reached a stage of development where the assignment of atomic positions is no longer sufficient. An estimate of the accuracy of the derived structural information is necessary. A sensitivity analysis of the entire structural determination procedure provides this estimate. Several questions are addressed by this analysis. The effects of choices of the nongeometrical parameters on the geometrical results are studied. An estimate of the accuracy of structural assignments is inferred from the results. It appears that a simple least squares methodology (with an ultimate accuracy of +- 0.05 A) is the most logical choice for these problems.
- Research Organization:
- Department of Chemistry, Princeton University, Princeton, New Jersey 08544
- OSTI ID:
- 5618024
- Journal Information:
- J. Chem. Phys.; (United States), Journal Name: J. Chem. Phys.; (United States) Vol. 79:7; ISSN JCPSA
- Country of Publication:
- United States
- Language:
- English
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