Applications of the lateral shearing interferometer in measurement of synchrotron radiation optical elements
The use of a single plate shearing, or Murty, interferometer for measuring the surface quality of several optical elements is reviewed and several results are given. The principle of the Murty interferometer is also explained. (LEW)
- Research Organization:
- Brookhaven National Lab., Upton, NY (USA)
- DOE Contract Number:
- AC02-76CH00016
- OSTI ID:
- 5609599
- Report Number(s):
- BNL-40626; ON: DE88005184
- Country of Publication:
- United States
- Language:
- English
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