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Title: High-T sub c superconductor quantum interference devices

Patent ·
OSTI ID:5589293

This patent describes a superconductive quantum interferometric device for sensing a characteristic of a magnetic field. It comprises a substrate having a surface, the substrate being selected from the group which consists of strontium titanate, aluminum oxide, sapphire, ZrO{sub 2} and mixtures thereof; a coating of MgO on the surface of the substrate; two identical thin-strip films of a high-critical temperature superconductor on the coating, each of the films having a pair of mutually parallel arms in the form of superconductor strips extending toward and aligned with super conductor strips forming corresponding arms of the other thin-strip film, and a crossbar strip connecting the arms of each thin-strip film at right angles to the arms, the high-critical-temperature superconductor being selected from the group which consists of yttrium-barium-calcium-copper-oxides, bismuth-strontium-calcium-copper-oxides, thallium-barium-copper-oxides, thallium-barium-calcium-copper-oxides, barium oxide: potassium oxide: bismuth oxides, and calcium oxide: zinc oxide: iron oxides; and insulating films on the coating between corresponding free ends of the arms thin-strip films, the insulating films being composed of a material selected from the group which consists of silicon dioxide, silicon nitride, magnesium oxide and mixture thereof.

Assignee:
International Superconductor Corp., Riverdale, NY (United States)
Patent Number(s):
US 5075283; A
Application Number:
PPN: US 7-321262
OSTI ID:
5589293
Resource Relation:
Patent File Date: 9 Mar 1989
Country of Publication:
United States
Language:
English